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    • Introduction to X-ray Scattering

      When a sample is illuminated by x-rays, these incident x-rays can be deflected and scattered by the sample, producing complex patterns. Analysis of these patterns, their intensities as well as the angle of scatter (incident vs scattered x-rays), changes in polarization, wavelength, and/or energy, can reveal structural, elemental and atomic information about the sample, and are known as x-ray scattering techniques.

    • Introduction to X-ray Microscopy

      The ability to image smaller and smaller samples allows us to see the previously unseen and analyze even the smallest parts of the universe, from viruses to proteins and even the atomic structure of materials.

    • Fundamentals behind modern scientific cameras

      Scientific cameras are essential for taking images of scientific research to understand the phenomena surrounding us. A key aspect of scientific cameras is that they are quantitative, with each camera measuring the number of photons (light particles) which interact with the detector.

    • Camera Gain

      When a sensor detects a photon, photoelectrons are released within the pixel (for more information, see our fundamentals page). The number of photoelectrons is measured at the end of exposure and a digital number produced. This is called the analog-to-digital unit (ADU) or the ‘gray level’.

    • ICCD and emICCD Cameras: The Basics

      Intensified CCD (ICCD) cameras use a CCD sensor combined with an intensifier. They are optimal for low-light or single photon applications due to the electron multiplying component of the intensifier.

    • Control of Ultrafast Non-Linear Interactions in Materials and Plasmonic Nanostructures

      Research in the lab of Haim Suchowski generally centers around controlling ultrafast optical processes on the nanoscale. One of the labs main projects investigates the non-linear interaction of plasmonic nanostructures with ultrashort laser pulses with temporal width of 6-20fs.

    • Scientific CMOS (sCMOS) Cameras: The Basics

      Complementary metal-oxide-semiconductor (CMOS) sensors are a technology that has been around since the 1990s. Early CMOS cameras were competing with the more mature CCD technology, but over the 1990s and early 2000s CMOS sensor technology improved to the point where CCD technology was overtaken to become the sensor of choice for consumer digital cameras.

    • Measuring Fusion Plasmas Using Spectroscopy

      The fusion diagnostics and control group led by Ted Biewer at Oak Ridge National Laboratory specializes in measuring and monitoring properties of plasmas in fusion experiments. We talked to Drew Elliott, a scientist in the group: “What we do in our group is develop and operate diagnostics to better characterize a lot of these experiments.”

    • Real-Time Imaging of Singlet Oxygen via Microspectroscopy

      Molecular oxygen is one of the most important molecules in maintaining life as well as in mechanisms by which life is extinguished and materials destroyed.

    • Measuring Large Scale Interactions Between Surfaces with nm Precision to Better Understand Geological Formations

      Although we perceive geological processes on macroscopic length scales, the mechanical behavior of geological structures can be significantly influenced by the microscopic mineral structure of rocks as well as the micro-scale interactions at the contacting mineral surfaces. Microscopic and nanoscale spaces between mineral grains often contain fluids and water that can reactively erode or deposit material, e.g. by promoting crystallization processes.

    • Deep Depleted CCD Cameras for Raman Spectroscopy In vivo and Medical Diagnostics

      Raman spectroscopy is an important measurement technique in life sciences and biotechnology, from nanoscale experiments analyzing the structure of single biochemical molecules to detection of disease and monitoring properties of tissue.

    • Introduction to Raman Spectroscopy

      Raman spectroscopy is an optical scattering technique that is widely used for the identification of materials and the characterization of their properties. It is commonly applied in material science, chemistry, physics, life science and medicine, the pharmaceutical and semiconductor industries, process and quality control and forensics.

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